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Multilayers XS-55， XS-N， XS-C， XS-B
Multilayers are not natural crystals but artificially produced “l(fā)ayer analyzers.” The lattice plane distances d
are produced by applying thin layers of two materials in alternation onto a substrate (Fig. 18). Multilayers
are characterized by high reflectivity and a somewhat reduced resolution. For the analysis of light
elements the multilayer technique presents an almost revolutionary improvement for numerous
applications in comparison to natural crystals with large lattice plane distances.
Fig. 18: Diffraction in the layers of a multilayer crystal
XS-55:
The most commonly used multilayer with a 2d-value of 5.5 nm for analyzing the elements N to Al and Ca
to Br; standard application for measuring the elements F， Na and Mg.
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